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Certified Tester Test Automation Engineer

Last Update Apr 21, 2024
Total Questions : 80

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Last Update Apr 21, 2024
Total Questions : 80

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Last Update Apr 21, 2024
Total Questions : 80

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Certified Tester Test Automation Engineer Questions and Answers

Questions 1

As the TAE, you are working with the organisation's Test Manager to decide which external metrics and which internal metrics should be gathered for the new TAS.

Which of the following represents the BEST internal metric that would help measure the quality of the TAS and the number of problems associated with the TAS?

Options:

A.

The average maintenance cost to keep an automated test in sync with the SUT

B.

The number of hours of manual test effort saved by implementing a TAS

C.

A measure of defect density within the TAS automation code

D.

A measure of how many automated tests pass and fail

Questions 2

If you are tracking the frequency that a test automation code reports a defect that is not really a defect, what metric are you gathering?

Options:

A.

Tool scripting metrics

B.

Automation code defect density

C.

Trend metrics

D.

The number of false-fail results

Questions 3

You have executed an automated test suite for a product that was released into production. Although all the tests passed, there was a major failure in production in an area that was covered well by your automated tests.

You have run the automated tests again and one of the tests is now failing and this is directly related to the production defect that was raised. You decide to run the automated test suite again on the same version of the SUT and the test now passes.

What SHOULD you do now to verify the validity of the automated tests?

Options:

A.

Remove the intermittently failing test from the test suite and investigate the reason why the test sometimes passes and sometimes fails.

B.

Check that the production defect that was reported was an actual defect

C.

Run the automated test suite again and if the test now passes - do nothing

D.

Reference: https://www.researchgate.net/publication/341396240_Intermittently_Failing_Tests_in_the_Embedded_Systems_Domain